Learn more about Chromatic Confocal

Nanovea Profilometers are designed with leading edge Chromatic Confocal optical technology (Axial Chromatism).

  • The technique measures a physical wavelength directly related to a specific height without using any complex algorithms. This ensures accurate results for all surface conditions; unlike all other techniques.
  • Fast speed sensors are available to scan large surface at high accuracy. 
  • Nanovea range of 3D Non Contact Profilometers include small compact PS-50 to Large Pneumatic HS2000 and the first fully portable Profilometer, the Jr-25.


ST400 Profilometer

AFMPRO Profilometer
Atomic Force

JR100 Profilometer

U-Tower, 120 Heungdeokjungang-ro, Giheung-gu, Yongin-si, Gyeonggi-do, 16950 Korea