NanoLab

Complete Description

Thanks to its modularity and the wide range of accessories and attachments available, Explorer allows to perform measurement in different configurations:

X-Ray Powder Diffraction (XPD)
Reflectometry (XRR)
Grazing Incidence X-Ray Diffraction (GIXRD)
High Resolution X-Ray Diffraction (HRXRD)
Total X-Ray Fluorescence (TXRF)
Residual Stress and Texture X-Ray Diffraction.

The modularity and the flexibility of the Explorer equipment allows to start with an entry-level system which can be upgraded to meet new end user requirements. GNR could supply a wide range of X-ray sources, optics, sample holders, detectors and configurations to satisfy several analytical needs.

With no limits to its applications, Explorer modular system offers high performances in all analytical areas, ranging from phases quantification of mixtures, to the determination of microstructural properties as residual stress and preferred orientation of crystallites on bulk materials as well as on thin films.

Product Applications

Routine Cystalline phase identification and quantification

Crystallite size – lattice strain and crystallinity calculation
Polymorph screening and crystal structure analysis
Residual Stress and Retained Austenite Quantification
Thin Films, Depth Profiling and non ambient analysis
Phase Transition monitorin, tecture and preferred orientations

The optics permit switches between Bragg-Brentano, focusing and parallel beam geometry using Johansson or parabolic mirror monochromators.

The high resolution reflectometry studies can be performed with EXPLORER to characterise layer thickness (from 1 to 500 nm with an accuracy better than 1%), density (with an accuracy better than ± 0.03 g/cm3), surface and interface roughness (from 0 to 5 nm with an accuracy better than ± 0.1 nm).

Measurements at low angles and a thin film attachment for parallel beam geometry allow the study of thin films and multilayers.

The coupling between a parabolic mirror monochromator and a channel-cut crystal mounted on the incident beam allows to realise a monochromatic parallel beam with high intensity and low divergence, suitable for high resolution measurements.

Software Informations

Data Collection Programs

GNR offers a large variety of acquisition programs, for standard as well as for customized hardware configurations. the list includes programs for powder and high resolution diffractometers, retained austenite, data acquisition of stress (plane and triaxial) and thin films (XRD and GIXRD).

SAX

Single peak analysis; peak treatment. Background subtraction, smoothing, deconvolution and peak localisation. Structural Analysis, Crystallite Size, Lattice Strain, Reflectometry, Quantitative Analysis.

Search and Match: MATCH!

Rietveld refinement, Display and compare multiple diffraction partners, Directly view specific phases/entries, instant usage of additional information, saving of selection criteria, Comfortable definition of background, Improved zooming facilities, Batch processing and Automatics.